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PIUG Annual 2017 Conference
May 20, 2017 - May 20, 2017 - May 25, 2017 - May 25, 2017
Gridlogics workshop @ PIUG on May 21, Sunday 11:30am – 12:30pm, Dunwoody C
Introducing PatSeer Pro – No hyperboles. Just serious analysis tools with great looking, flexible and interactive visualizations!
Good at Search? Now meet the most comprehensive set of powerful Analysis, Reporting and visualization tools in PatSeer Pro that requires only search expertise.
PatSeer Pro includes a comprehensive set of analytical tools needed for precise technology landscaping and competitive intelligence projects such as Assignee cleanup tools, Co-occurrence Matrices, configurable Chart Dashboards, multi-generation Citation Analysis, Text Clustering and VizMAP – a spatial exploration and contour mapping visualization engine. It combines the power of PatSeer’s global search and collaboration capabilities with the powerful patent analysis tools of Patent iNSIGHT Pro in a single integrated web based platform.
Join our workshop to see PatSeer Pro in action and to learn how you can use it for your patent analysis needs.
This Workshop will help you answer the following questions:
- What’s new at PatSeer since the last PIUG workshop and why professional searchers are liking PatSeer even more
- What is PatSeer’s new powerful web based patent analytics platform – PatSeer Pro and how does it compare to Patent iNSIGHT Pro
- What are the analytic tools and visualizations in PatSeer Pro and how can you leverage them to take on complex analytical tasks
- How does PatSeer Pro gives you the flexibility you always wanted as a patent analyst
- Little known tricks of Patent Analytics which saves you time and gets you to the insights quickly