PatSeer has been developed keeping users need for secure collaboration and sharing in mind. The PatSeer platform has multifaceted capabilities and so we have organised its features into various categories:
PatSeer Content
| Feature | Description |
|---|---|
| Coverage | Includes full text of US,EP,WO,DE,GB,FR,JP,CN KR and CA. Also Includes searchable JP Abstracts, CN and FR English Translations and bibliographic data from 90+ countries as part of INPADOC data. (Approximately 30 million full text records in a database of 60 million+ records) |
| Corporate Tree | Integrated Corporate Tree for Top 2500 Assignees within search page so that you can lookup subsidiaries and include them in your company searches |
| Normalized Assignees | Assignee names have been cleaned up manually using in-house tools for more precise search and analytics |
| Latest Assignee | Reassignments data for US records integrated into results |
| Maintenance Data | Maintenance status for US patents has been integrated into results |
| Priority Information | Priority Numbers and data available for every record and integrated into search results |
| Patent Family | Both Simple and Extended Family information integrated into results |
| Searchable Legal Status | INPADOC Legal Status linked with each record and searchable along with other fields. Current Legal Status is calculated for each records and available as a separate search field |
| Front Page Images | Front page drawings for US,EP,WO,DE,JP,CH,GB,FR records displayed along with results. |
| Image Mosaic | Links to mosaic of all patent images |
| PDFs | Links to view PDF for each record. PDF coverage available for all major authorities US,EP,WO,GB,FR,DE,JP,CN and more |
| Citations | Backward/Forward Citations available for US and most European authorities with a indication of Examiner and Inventor Citations. |
| Classification Descriptions | US and International (IPC) Class Descriptions integrated into the search results for instant lookup |
| Assignee and Inventor Country | Country information provided for Assignees and Inventors where available |
| Estimated Expiry Date | Estimated Expiry Date calculated for each patent and available for search and filtering |
| Earliest Priority and Publication date | Earliest Priority and Publication date from the family has been precalculated and linked to each record |
Click To View Demo Screens From The PatSeer Platform
PatSeer Welcome Screen
Quick List View
Standard View
Searching
| Feature | Description |
|---|---|
| Search Forms | Quick Search, Field Search, Command Line and Number Upload |
| Semantic Search Suggester | See keywords or concepts that are related to your search and improve search precision |
| Search Fields | Search by All text fields, US, IPC(8-9), IPC(1-7) and ECLA classifications, Assignee/Inventor Country, Attorney Agent, Examiner, Earliest Priority Date, Legal Status and more |
| Lookup Matching Assignee / Inventor | Lookup all variations of the Assignee or Inventor name you are searching for and include them in your search. |
| Search Syntax | Includes advanced Search capabilities needed by professional searchers such as complex Boolean, wildcards, proximity, fuzzy, nested Boolean proximity queries and range queries. All special characters and even operator words as and/or/not are also searchable. |
| Manage Searches | See all the searches done in the last 30 days. Combine complex search strings or save search sets. |
| Alerts | Receive Email Alerts of any new records being published in your area of interest. |
Field Search
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Viewing Results
| Feature | Description |
|---|---|
| Multiple Result Views | Multiple Result views for quick browsing and reviewing of results |
| Sort Results | Sort results by search relevancy, latest Publication or application date, most cited and least time-to-grant. |
| Custom View | Choose exactly which fields to see in a smart Excel type view |
| Detailed View | Supports results browsing so that user can run through each result right within the detailed view itself. Detailed View tab can be moved to separate monitor so that user can browse through results one by one conveniently |
| Side-by-side View | See multiple aspects of the record at the same time without scrolling |
| One Record per Window | Each record can be opened in a new Window/Tab |
| Term Highlighting | Multi color highlighting with advanced capabilities such as partial word portion highlighting and setting multiple words (synonyms) to the same color |
| Save View Settings | Save all view preferences with single click |
Tabular View
Standard + Family View
Analyzing Results
| Feature | Description |
|---|---|
| Results Filtering | Powerful filters help you narrow down results with ease. User can combine filters across fields to answer complex questions like “Which are the key IPC Classes for inventions coming from Japanese division of a multinational conglomerate company between 2000-2005”. |
| Quick Stats | Great looking configurable charting that works over million records with sub second response times |
| Chart Layers | Generate multi and cross dimensional charts/tables using our unique first-in-industry chart layering technology |
| Citation Tree | View forward and backward citations of a records displayed yearwise in a tree with a single click. |
| Family Tree | Visualise the relationships between all the publications that result from the original application. Family Tree is also configurable by the user and modified trees can be saved too. |
| Forward / Backward Co-citations | Instantly search for records that are similar to a particular records using co-citation analysis. View forward or backwads co-cites of a records ranked by number of shared citations. |
Quick Stats Eg. 1
Quick Stats Eg. 2
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Exporting Results
| Feature | Description |
|---|---|
| Word / Excel | Export records in ready to use Word or Excel reports. Charts for key stats can also be including in Word and Excel reports. |
| CSV / XML | XML import for importing data in other analysis tools |
| Patent iNSIGHT Pro Export | Replicate your results sets into Patent iNSIGHT Pro with easy and minimum time. All additional meta data such as custom fields, rating, categorizations etc is also exported and recreated in Patent iNSIGHT Pro. |
Exporting Records