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Welcome to a refreshingly smarter way of working with Patent Data!

Searching through vast patent databases, sorting, filtering, comparing, analyzing, creating reports and project management has typically involved tedious processes and juggling large amounts of files. PatSeer takes the ‘tedious‘ out of the equation and brings you a fresh Web 2.0 approach to searching, analyzing, comparing, collaborating, sharing and managing patent data projects. It’s simple, smart and powerful enough to impress the pro’s. Don’t take our word for it…try it to see for yourself.

Whats New at PatSeer…..

Jan’16 – PatSeer Content update – 5 additional full-text authorities, translations and more

PatSeer is pleased to announce addition of full-text from Denmark, Finland, Belgium, Netherlands and Luxembourg along with English translations. We have expanded the German full-text collection with a retrospective dataset for the period 1920-1959 and the full-text of German patent and applications are now available 1920 onwards. We have also started loading Russian full-text translations. Read More here.

Nov’15 – Introducing Search Recall, Citation Categories and more

We are pleased to announce an industry-first Search Recall capability that allows you to remember all your annotations and actions for search results so that you don’t have review the same record again. You can use recall in zones so that you can choose when to see past ratings or comments and when not. This months release also brings many other search, result-review and export enhancements based on feedback we received. Read More here.

Aug’15 – Introducing Custom Tables, Multiple Custom Views and many searching enhancements

We are pleased to announce addition of Swedish and Norway full-text collections and an industry-first capability of Custom Tables that allows you to save complex relational metadata on a per record basis. These fully customisable tables are well-suited for needs of large biopharma, chemical and electronic companies who require more than just multi-valued lists or text custom fields. The new release also includes many exciting searching, result-viewing and other enhancements. Read More here.


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Quick Overview

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Sign Up & Try It For Free


Search through our comprehensive patent database of 92 million+ records covering more than 102+ countries (incl. 26 full text authorities) using a fully featured search interface that has all the tools needed by a professional searcher. Sort results by dates, relevance and most cited records or view them in different viewing formats designed to enable quick review and scanning of large result sets. Narrow down results with our powerful filtering options that work with ease even over 100K + results.

Create Projects

Save your results set to a project where you can rank, flag, comment on each record. Define any number of custom fields or create a hierarchical categorization to place records into. Powerful filtering technology allows you to combine all these additional fields with standard patent fields in a powerful yet intuitive interface.

Collaborate & Share

Decide who can access your projects, what their roles are and how you’d like to manage it. Collaborate on your patent data projects within your organization or external collaborators with ease. Setup multiple dashboards ( Patent Dashlets®) that include different combination of patent and custom fields and share them selectively with different users.


Leverage Normalized Assignee Names, Integrated Reassignment information and maintenance data  in your analysis. Our powerful filtering technology works over categories and custom fields and makes it easy to answer complex questions with only a few clicks of the mouse. Co-citations, Family Tree, Citation Tree and many other tools help you gain and deliver insights with ease.

PatSeer aims to redefine Patent Research, Analysis, Project Management & Collaboration

Upcoming Events

7-9, Jan 2016 - 8Th Global IP Convention, New Delhi, India

18–19, Apr 2016 - II SDV 2016 : Nice, France

21-26, May 2016 - PIUG Annual 2016 Conference, Vancouver, Washington, USA

8-9, June 2016 - PATINFO 2016 Technischen Universität Ilmenau, Ilmenau, Germany

8-10 Nov 2016 - EPO Patent Information Conference 2016 - Madrid, Spain

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